High aspect ratio pattern collapse of polymeric UV-nano-imprint molds due to cleaning
High aspect ratio pattern collapse of polymeric UV-nano-imprint molds due to cleaning
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DOI:
10.1016/j.mee.2013.02.065
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发表时间:
2013-10
影响因子:
2.3
通讯作者:
A. Finn;B. Lu;R. Kirchner;X. Thrun;K. Richter;W. Fischer
中科院分区:
文献类型:
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作者:
A. Finn;B. Lu;R. Kirchner;X. Thrun;K. Richter;W. Fischer