A2DTest: A complete integrated solution for on-chip ADC self-test and analysis
A2DTest: A complete integrated solution for on-chip ADC self-test and analysis
复制标题
A2DTest：片上 ADC 自测试和分析的完整集成解决方案
DOI：
10.1109/test.2009.5355722
复制
发表时间：
2009
期刊：
影响因子：
--
通讯作者：
Thomas Fleischmann
中科院分区：
文献类型：
--
作者：
Brendan Mullane;Vincent O’Brien;Ciaran MacNamee;Thomas Fleischmann
提出了一种片上BIST解决方案，可执行精确的ADC测量。该平台能够并行进行线性和动态测试，显著降低测试时间和成本。片内硬件资源针对ADC测试应用进行了优化。
An on-chip BIST solution performing accurate ADC measurements is presented. The platform enables linear and dynamic testing to occur in parallel, significantly lowering test time and cost. On-chip hardware resources are optimized for ADC test application.