A 7-nm FinFET 1.2-TB/s/mm$^{2}$ 3D-Stacked SRAM Module With 0.7-pJ/b Inductive Coupling Interface Using Over-SRAM Coil and Manchester-Encoded Synchronous Transceiver

A 7-nm FinFET 1.2-TB/s/mm$^{2}$ 3D-Stacked SRAM Module With 0.7-pJ/b Inductive Coupling Interface Using Over-SRAM Coil and Manchester-Encoded Synchronous Transceiver
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具有 0.7pJ/b 电感耦合接口(使用 Over-SRAM 线圈和曼彻斯特编码同步收发器)的 7-nm FinFET 1.2-TB/s/mm$^{2}$ 3D 堆叠 SRAM 模块

DOI:
10.1109/jssc.2022.3224421
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发表时间:
2022
影响因子:
5.4
通讯作者:
and T. Kuroda
and T. Kuroda
中科院分区:
工程技术1区
文献类型:
--
作者:
K. Shiba;M. Okada;A. Kosuge;M. Hamada;and T. Kuroda

文献摘要

相似文献

在7纳米FinFET工艺中开发了用于3D堆叠静态随机存取存储器(SRAM)的0.7-pJ/位、8.5-Gb/s/链路电感耦合芯片间无线通信接口。一种新的物理放置方法,允许线圈放置在具有小磁场衰减的现成SRAM宏上,同时使用曼彻斯特编码和时钟比较器进行同步通信,以检测小摆幅信号,与基于硅通孔(TSV)的堆叠相比,SRAM芯片面积减少了26%。使用测试芯片确认了0.7 pJ/bit、8.5 Gb/s/链路的芯片间通信。使用该接口的4层3D堆叠SRAM模块的面积效率达到了1.2 TB/s/mm 2,比现有的3D堆叠SRAM提高了两个数量级。
A 0.7-pJ/bit, 8.5-Gb/s/link inductive coupling interchip wireless communication interface for a 3D- stacked static-random access memory (SRAM) has been developed in a 7-nm FinFET process. A new physical placement method that allows coils to be placed over off-the-shelf SRAM macros with small magnetic field attenuation, together with the use of synchronous communication using Manchester encoding and a clocked comparator to enable the detection of small-swing signals, achieves a 26% reduction in SRAM die area compared to through-silicon via (TSV)-based stacking. Interchip communication at 0.7 pJ/bit, 8.5 Gb/s/link was confirmed using test chips. A 4-hi 3D- stacked SRAM module using the proposed interface achieves a 1.2-TB/s/mm2area efficiency, representing a two orders-of-magnitude improvement over the state-of-the-art 3D- stacked SRAM.