K.Shimada, S.Katsube, T.Ishimaru, H.Kawada, and I.Ohdomari: "Consideration on the quantitativeness of reflection high energy electron diffraction intensity as a tool to monitor the coverage of the Si(111) surface by 7*7 domains" Japanese Journal of Applie

K.Shimada, S.Katsube, T.Ishimaru, H.Kawada, and I.Ohdomari: "Consideration on the quantitativeness of reflection high energy electron diffraction intensity as a tool to monitor the coverage of the Si(111) surface by 7*7 domains" Japanese Journal of Applie
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K.Shimada、S.Katsube、T.Ishimaru、H.Kawada 和 I.Ohdomari:“考虑反射高能电子衍射强度的定量性作为监测 Si(111) 表面覆盖率的工具 7*

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