Characterization of Surface Viscoelasticity and Energy Dissipation in a Polymer Film by Atomic Force Microscopy
Characterization of Surface Viscoelasticity and Energy Dissipation in a Polymer Film by Atomic Force Microscopy
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DOI：
10.1021/ma201148f
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发表时间：
2011-10
期刊：
影响因子：
5.5
通讯作者：
Dong Wang;X. Liang;Yan-hui Liu;S. Fujinami;T. Nishi;K. Nakajima
中科院分区：
文献类型：
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作者：
Dong Wang;X. Liang;Yan-hui Liu;S. Fujinami;T. Nishi;K. Nakajima
了解聚合物表面的特性对于粘合、润湿和摩擦等领域新应用的开发至关重要。 1-6 然而，这一努力受到了阻碍，因为在大多数情况下，将散装材料的物理参数外推为表面的物理参数是不合适的。许多报告表明，靠近自由表面的聚合物材料可能具有与本体相当大的性能偏差。 7-13 因此，精确定量的表面力学表征一直是一个长期存在的学术和技术挑战。原子力显微镜 (AFM)，特别是调幅动态 AFM (AM-AFM)，是一种通用技术，用于探测各种材料的结构和性能，具有高空间分辨率和在各种条件下工作的能力。最近，AM-AFM 已被开发出来，通过测量在tipÀ样品相互作用期间由能量耗散 Edis 产生的相移 phi 来表征纳米级材料特性
The understanding of properties of polymer surfaces is crucial for the development of new applications in areas such as adhesion, wetting, and friction. 1À6 This effort is hindered, however, by the fact that in most cases it is not appropriate to extrapolate physical parameters of the bulk material as the surface’s. Numerous reports have shown that polymeric material near a free surface can have properties which deviate considerably from the bulk. 7À13 Thus, precise quantitative surface mechanical characterizations have been a long-standing academic and technological challenge.Atomic force microscopy (AFM), particularly the amplitudemodulation dynamic AFM (AM-AFM), is a versatile technique for probing the structure and properties of a wide range of materials with high spatial resolution and capacity to work under various conditions. Recently, AM-AFM has been developed to characterize nanoscale material properties by measuring the phase shift ϕ, arising from the energy dissipated, Edis, during tipÀ sample interactions