Indirect Determination of the Piezospectroscopic Coefficients of Ceria‐Stabilized Tetragonal Zirconia Polycrystals
Indirect Determination of the Piezospectroscopic Coefficients of Ceria‐Stabilized Tetragonal Zirconia Polycrystals
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二氧化铈稳定四方氧化锆多晶压电光谱系数的间接测定
DOI：
10.1111/j.1151-2916.2002.tb00543.x
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发表时间：
2004
影响因子：
3.9
通讯作者：
V. Sergo
中科院分区：
文献类型：
--
作者：
H. Tomaszewski;J. Strzeszewski;L. Adamowicz;V. Sergo
提出了一种间接确定陶瓷材料/相光谱带的应力依赖性（表示为压谱（PS）系数）的方法。这种方法是基于两个相/材料的紧密混合物（紧密的微观结构，晶粒尺寸水平）时，在一个独立的应力是已知的，它是用来确定最强烈的拉曼带的PS系数在氧化铈稳定的四氧化锆多晶（Ce-TZP）。将不同量的Ce-TZP与氧化铝混合并烧结复合颗粒;随后，通过其R2发光带的PS系数和来自静态平衡条件的Ce-TZP中的应力来确定氧化铝中的应力。Ce-TZP的每个拉曼带的频移已经相对于应力作图，并且斜率提供PS系数。该方法具有不需要任何类型的装载装置（即，金刚石砧室，弯曲夹具）。最后，还讨论了限制，最重要的是两种材料/相的不可混溶性的要求。
A method is proposed for the indirect determination of the stress dependence (expressed as piezospectroscopic (PS) coefficients) of spectroscopic bands of ceramic materials/phases. This method is based on the intimate mixture (intimate at the microstructural, grain-size level) of two phases/materials when the stress in one is independently known; it is used to determine the PS coefficients of the most intense Raman bands in ceria-stabilized tetragonal zirconia polycrystals (Ce-TZP). Different amounts of Ce-TZP were mixed with alumina and the composite pellets sintered; subsequently, the stress in alumina was determined through the PS coefficient of its R2 luminescence band and the stress in Ce-TZP derived from the static equilibrium condition. The frequency shifts of each Raman band of Ce-TZP have been plotted against the stress and the slopes provide the PS coefficients. The method has the advantage of not requiring any type of loading device (i.e., diamond anvil-cell, bending jig). Finally, the limits are also discussed, the most important one being the requirement of immiscibility of the two materials/phases.