Helium I Line Intensity Ratios in a Plasma for the Diagnostics of Fusion Edge Plasmas

Helium I Line Intensity Ratios in a Plasma for the Diagnostics of Fusion Edge Plasmas
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用于诊断聚变边缘等离子体的等离子体中的氦 I 线强度比

DOI:
10.1063/1.1147060
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发表时间:
1995
影响因子:
1.6
通讯作者:
K. Kadota
K. Kadota
中科院分区:
工程技术4区
文献类型:
--
作者:
S. Sasaki;S. Takamura;S. Watanabe;S. Masuzaki;Takako Kato;K. Kadota

文献摘要

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氦I线强度比的碰撞辐射模型,包括新推荐的激发速率系数和热电子的影响,使我们能够测量电子密度(ne)和温度(Te)在高密度等离子体。使用492.2 nm测量ne和Te(4 1D→2 1P)/471.3 nm(4 3S→2 3P),504.8 nm(4 1S→2 1P)/471.3 nm,和492.2 nm/504.8 nm谱线强度比与NAGDIS-I线性装置中氦放电等离子体中的朗缪尔探针结果非常一致(名古屋大学分流器模拟器),用于1011-4×1012 cm−3和5-20 eV的ne和Te区域。热电子在等离子体中是重要的He I线的发射时,Te是低于激发能量<$20 eV。计算中考虑了共振散射效应,解释了501.6nm(3 1 P →2 1 S)谱线发射增强的实验结果。
Helium I line intensity ratios obtained by a collisional radiative model, including new recommended excitation rate coefficients and the effects of hot electrons, enable us to measure electron density (ne) and temperature (Te) in high density plasma. Measured ne and Te using 492.2 nm (4 1D→2 1P)/471.3 nm (4 3S→2 3P), 504.8 nm (4 1S→2 1P)/471.3 nm, and 492.2 nm/504.8 nm line intensity ratios are in good agreement with the Langmuir probe results in the helium discharge plasma in the NAGDIS‐I linear device (Nagoya University Divertor Simulator) for ne and Te regions of 1011–4×1012 cm−3 and 5–20 eV. Hot electrons in the plasma are important for the He I line emissions when Te is below the excitation energy ≊20 eV. A resonance scattering effect included in the calculation accounts for the experimental result of the enhanced 501.6 nm (3 1P→2 1S) line emission.