Influence of subsurface microstructure on the running-in of an AlSi alloy
Influence of subsurface microstructure on the running-in of an AlSi alloy
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DOI：
10.1016/j.wear.2015.02.044
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发表时间：
2015-05-01
期刊：
影响因子：
5
通讯作者：
Scherge, M.
中科院分区：
文献类型：
--
作者：
Linsler, D.;Schlarb, T.;Scherge, M.
利用放射性核素辅助销盘摩擦试验机研究了润滑AlSi11Cu3圆盘与100Cr6销接触时的摩擦磨损行为。众所周知，剪切力会改变近表面材料的化学成分和微观结构，从而影响摩擦磨损。为了更好地了解显微组织对磨合行为的影响，在恒定应力条件下对不同硅相形态的圆盘进行了试验。采用白光干涉法、X射线光电子能谱等手段对摩擦磨损试验前后销盘的表面形貌、化学成分和显微组织进行了表征。光谱学、俄歇电子能谱和聚焦离子束显微镜。用放射性核素技术测量销钉的磨损，以解决超低磨损率问题。为了表征近表面的变形，植入了Ga离子标记物，并用俄歇电子能谱跟踪其剪切诱导的位移。为了监测地下剪切，对柱状标记物的变形进行了分析。使用戈德特的第三身体模型对结果进行了讨论。此外，结果还允许我们将该模型扩展到在超低磨损率下运行的系统。(C)2015爱思唯尔B.V.保留所有权利。
The friction and wear behavior of a lubricated AlSi11Cu3 disk in contact with a 100Cr6 pin was studied by a radionuclide-assisted pin-on-disk tribometer. It is well known that shear forces change chemistry and microstructure of the near-surface material, thereby influencing friction and wear. To better understand the influences of the microstructure on the running-in behavior, disks with different silicon phase morphologies were tested under constant stressing conditions. Topography, chemistry and microstructure of pin and disk were characterized before and after tribological testing by white light interferometry, X-ray photoelectron. spectroscopy, Auger electron spectroscopy and focused ion beam microscopy. Wear of pins was measured with a radionuclide technique to resolve ultra-low wear rates. To characterize near-surface deformations, Ga ion markers were implanted and Auger electron spectroscopy was applied to follow their shear-induced displacements. To monitor subsurface shear, the deformation of columnar markers was analyzed. The results were discussed using Godet's third body model. Furthermore, the results allowed to us extend the model to systems operated under ultra-low wear rates. (C) 2015 Elsevier B.V. All rights reserved.