SEE and TID results for a commercially fabricated radiation hardened field programmable gate array
SEE and TID results for a commercially fabricated radiation hardened field programmable gate array
复制标题
商业制造的抗辐射现场可编程门阵列的 SEE 和 TID 结果
DOI：
10.1109/redw.2004.1352910
复制
发表时间：
2004
期刊：
影响因子：
--
通讯作者：
T. Farris
中科院分区：
文献类型：
--
作者：
C. Hafer;R. Lake;A. Jordan;T. Farris
Aeroflex的RadHard-by-Design商业制造的现场可编程门阵列为航空航天IC用户提供了抗辐射的快速解决方案。给出了单粒子翻转、单粒子闭锁和电离总剂量的表征结果。
Aeroflex's RadHard-by-Design commercially fabricated field programmable gate array provides a radiation hardened quick-turn solution to aerospace IC users. Characterization results for single event upset, single event latchup and total ionizing dose are presented.