Accounting for sample morphology in correlative X-ray microscopy via ray tracing
Accounting for sample morphology in correlative X-ray microscopy via ray tracing
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DOI：
10.1557/s43580-021-00114-0
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发表时间：
2021-07
期刊：
影响因子：
0.8
通讯作者：
Rishi E. Kumar;Xueying L. Quinn;D. Fenning
中科院分区：
文献类型：
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作者：
Rishi E. Kumar;Xueying L. Quinn;D. Fenning
多模态显微镜数据的相关性可以通过不同的探针-样品相互作用和每个模态的信号收集几何结构来系统地减少。因此，从相关数据集中提取科学见解需要仔细考虑相关显微镜中使用的特定模式且通常不重叠的采样体积。在这里，我们描述了一个笔形束，射线跟踪方法，占有限的程度和粗糙度的薄膜和纳米材料在同步加速器为基础的X射线显微镜测量，创建一个第一近似的探针样品相互作用的每一个模态，收紧多模态X射线纳米探针表征的相关性。作为一个示范性的例子，我们分析的结构-功能相关性在连续显微镜的Eu：CsPbBr 3卤化物钙钛矿薄膜晶体在三个不同的测量模式下获得的数据。我们的射线跟踪校正占当地的荧光矩阵效应和采样体积的差异，并揭示隐藏在原始数据中的结构，成分和光电关系。
The correlations in multi-modal microscopy data can be systematically reduced by the distinct probe-sample interactions and signal collection geometry for each modality. Extracting scientific insights from correlative datasets thus requires careful consideration of the mode-specific, and often non-overlapping, sampling volume used in the correlative microscopy. Here we describe a pencil beam, ray tracing method that accounts for the finite extent and roughness of thin-films and nanomaterials in synchrotron-based X-ray microscopy measurements, creating a first approximation of the probe-sample interaction for each modality that tightens correlations in multi-modal X-ray nanoprobe characterization. As a demonstrative example we analyze structure–function correlations in sequential microscopy data acquired for a Eu:CsPbBr3 halide perovskite thin-film crystal across three distinct measurement modes. Our ray-traced corrections account for local fluorescence matrix effects and sampling volume discrepancies and unveil structural, compositional, and optoelectronic relationships hidden in the raw data.