A convergent layer stripping algorithm for the radially symmetric impedence tomography problem

A convergent layer stripping algorithm for the radially symmetric impedence tomography problem
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径向对称阻抗层析成像问题的收敛层剥离算法

DOI:
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发表时间:
1992
期刊:
影响因子:
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通讯作者:
J. Sylvester
J. Sylvester
中科院分区:
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文献类型:
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作者:
J. Sylvester

文献摘要

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本文证明了二维径向对称阻抗层析问题的唯一性。更重要的是,我们引入了径向狄利克雷到诺伊曼映射的一个(可能不完整的)表征,并使用该表征来产生一个收敛算法来解决阻抗层析问题。
In this paper we prove uniqueness for the 2–dimensional radially symmetric impedence tomography problem. More importantly, we introduce a (possible incomplete) characterization of the radial Dirichlet to Neumann map and use that characterization to produce a convergent algorithm to solve the impedence tomography problem.