Temperature dependence of the lasing threshold current of double heterostructure injection lasers due to drift current loss
Temperature dependence of the lasing threshold current of double heterostructure injection lasers due to drift current loss
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DOI:
10.1063/1.328385
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发表时间:
1980-09
影响因子:
3.2
通讯作者:
P. Anthony;N. Schumaker
中科院分区:
文献类型:
--
作者:
P. Anthony;N. Schumaker
Contact‐limited, ambipolar transport, which describes the drift current behavior of minority carriers not confined to the active layer of double heterostructure injection lasers, is used to predict different behavior than previous calculations for the temperature dependence of the threshold current for lasing. The high‐temperature coefficients of some lasers may more easily be explained using the model.