Time-resolved retardance and optic-axis angle measurement system for characterization of flexoelectro-optic liquid crystal and other birefringent devices.
Time-resolved retardance and optic-axis angle measurement system for characterization of flexoelectro-optic liquid crystal and other birefringent devices.
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DOI：
10.1364/oe.26.006126
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发表时间：
2018-03
期刊：
影响因子：
3.8
通讯作者：
J. Fells;S. Elston;M. Booth;S. Morris
中科院分区：
文献类型：
--
作者：
J. Fells;S. Elston;M. Booth;S. Morris
提出了一种新的偏振计，它可以同时测量调制双折射光学器件的光轴角和线性相位延迟。适用于液晶及其它材料的动态波片器件的表征。它是全自动的，不需要对被测设备进行角度校准。系统的绝对角度误差<±0.3°，滞后误差<±0.44°，具有较好的相对精度。该方法已在手性向列液晶器件上进行了测试，该器件在均匀卧螺旋模式下具有3khz的柔性电光开关。这些结果代表了在快速开关频率下工作的液晶器件的首次时间分辨倾斜角和相位延迟测量。
A new polarimeter is presented which gives time-resolved measurements of both the optic-axis angle and the linear phase retardation for modulated birefringent optical devices. It is suitable for characterizing dynamic waveplate devices based on liquid crystal and other materials. It is fully automated and requires no angular alignment of the device under test. The system has an absolute angle error of < ± 0.3° and a retardance error of < ± 0.44°, with considerably better relative accuracy. The method has been tested with a chiral nematic liquid crystal device exhibiting flexoelectro-optic switching at 3 kHz in the uniform lying helix mode. These results represent the first time-resolved tilt-angle and phase retardation measurements for a liquid crystal device operating at fast switching frequencies.