Redox-Based Multilevel Resistive Switching in AlFeO3 Thin-Film Heterostructures
Redox-Based Multilevel Resistive Switching in AlFeO3 Thin-Film Heterostructures
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DOI:
10.1021/acsaelm.0c00083
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发表时间:
2020-03
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通讯作者:
Badari Narayana Rao;S. Yasui;Yefei Han;Yosuke Hamasaki;T. Katayama;T. Shiraishi;T. Kiguchi;M. Itoh-M
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文献类型:
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作者:
Badari Narayana Rao;S. Yasui;Yefei Han;Yosuke Hamasaki;T. Katayama;T. Shiraishi;T. Kiguchi;M. Itoh-M
Next-generation nonvolatile memory devices require many functionalities such as high-speed processing, low power consumption, lightweight, and a simple structure. The use of heterostructures with r...