High Energy Spectroscopy of Thin Films of Chalcopyrite Structure Cu–In–Se and Related Materials
High Energy Spectroscopy of Thin Films of Chalcopyrite Structure Cu–In–Se and Related Materials
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黄铜矿结构 Cu-In-Se 及相关材料薄膜的高能谱
DOI：
10.7567/jjaps.32s3.203
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发表时间：
1993
期刊：
影响因子：
--
通讯作者：
T. Wada
中科院分区：
文献类型：
--
作者：
S. Kohiki;M. Nishitani;T. Wada
用X射线光电子能谱实验评价了非化学计量比对黄铜矿结构的CuIn-Se薄膜电子态的影响，并用[CuSe4]和[InSe4]模型团簇的Hartree-Fock-Slate计算进行了理论预测。
Effects of non-stoichiometry on the electronic states of chalcopyrite structure Cu–In–Se thin films were evaluated experimentally by X-ray photoemission spectroscopy and predicted theoretically by Hartree-Fock-Slater calculation of [CuSe4] and [InSe4] model clusters.