Simple accurate system for measuring absolute photoluminescence quantum efficiency in organic solid-state thin films
Simple accurate system for measuring absolute photoluminescence quantum efficiency in organic solid-state thin films
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DOI：
10.1143/jjap.43.7729
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发表时间：
2004-11-01
期刊：
影响因子：
--
通讯作者：
Adachi, C
中科院分区：
文献类型：
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作者：
Kawamura, Y;Sasabe, H;Adachi, C
我们使用积分球精确测量了有机固态薄膜的绝对光致发光 (PL) 量子效率 (eta(PL))。我们特别测量了有机发光中使用的传统有机材料的eta(PL)。二极管，例如三(8-羟基喹啉)铝(III)络合物(Alq(3))和2wt%-fac-三(2-苯基吡啶基)铱(III):4,4'-双(咔唑-9-基)-2,2'-联苯[Ir(ppy)(3):CBP]共沉积膜。 Alq(3) 和 Ir(ppy)(3):CBP 显示 eta(PL) = 20 +/- 1% 和 97 +/- 2%，这与使用这些材料的外部电致发光效率很好地对应。我们还测量了它们的瞬态 PL 衰减，并用它们的 eta(PL) 确定了辐射率常数。
We accurately measured the absolute photoluminescence (PL) quantum efficiency (eta(PL)) of organic solid-state thin films using an integrating sphere. We particularly measured the eta(PL) of conventional organic materials used in organic light emitting. diodes, such as a tris(8-quinolionolato)aluminum(III) complex (Alq(3)), and a 2 wt%-fac-tris(2-phenylpyridyl)iridium(III): 4,4'-bis(carbazol-9-yl)-2,2'-biphenyl [Ir(ppy)(3):CBP] co-deposited film. Alq(3) and Ir(ppy)(3):CBP showed a eta(PL) = 20 +/- 1% and 97 +/- 2%, which corresponded well to external electroluminescence efficiency using these materials. We also measured their transient PL decay and determined the radiative rate constants with their eta(PL).