Persistent Scatterer Selection Incorporating Polarimetric SAR Interferograms Based on Maximum Likelihood Theory

Persistent Scatterer Selection Incorporating Polarimetric SAR Interferograms Based on Maximum Likelihood Theory
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DOI:
10.1109/tgrs.2016.2589762
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发表时间:
2017
影响因子:
8.2
通讯作者:
K. Ishitsuka;T. Matsuoka;M. Tamura
K. Ishitsuka;T. Matsuoka;M. Tamura
中科院分区:
工程技术1区
文献类型:
--
作者:
K. Ishitsuka;T. Matsuoka;M. Tamura

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使用单极化合成孔径雷达干涉图进行了持久性散射体干涉测量分析,但较新的合成孔径雷达卫星使极化数据能够用于此类分析。针对极化SAR干涉图的分析问题,提出了一种在PS选择阶段采用最大似然法的方法。与所提出的方法,干涉图在某一偏振分量表现出高的相干性有助于估计的表面位移,而另一偏振分量的噪声干涉图较少使用。所提出的方法进行了检查,通过分析全和双极化干涉图使用从ALOS/PALSAR图像在全极化采集模式获得的数据。结果表明,用于绘制地表位移图的相干像素数量有所增加,在分析全极化数据时,这一数量尤其增加。例如,在线性HV基的全偏振干涉图的情况下,与单偏振干涉图相比,数量增加了1.8-3.8倍,与单偏振数据结果的简单积分相比,增加了1.14倍。我们的方法增加了位移现象的详细空间位移模式的检测的准确性。
Persistent scatterer (PS) interferometry analysis has been performed using single-polarimetric synthetic aperture radar (SAR) interferograms, but newer SAR satellites enable the use of polarimetric data for such analyses. In this paper, to analyze polarimetric SAR interferograms, we proposed the maximum likelihood method at the PS selection stage. With the proposed method, interferograms in a certain polarimetric component exhibiting high coherence contribute to the estimation of surface displacements, whereas noisy interferograms of another polarimetric component are less used. The proposed method was examined by analyzing full- and dual-polarimetric interferograms using data obtained from ALOS/PALSAR images in full-polarimetric acquisition mode. The results showed an increase in the number of coherent pixels used to map surface displacements, and that number increased particularly in the analysis of full-polarimetric data. For example, in the case of full-polarimetric interferograms in linear HV basis, the number increased by a factor of 1.8-3.8 compared with those of single-polarimetric interferograms and by a factor of 1.14 compared with a simple integration of the results of single-polarimetric data. Our method increases the accuracy of the detection of the detailed spatial displacement pattern of a displacement phenomenon.