THIN-FILM STUDIES USING MULTIPLE-BEAM INTERFEROMETRY
THIN-FILM STUDIES USING MULTIPLE-BEAM INTERFEROMETRY
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DOI：
10.1016/0021-9797(73)90218-x
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发表时间：
1973-01-01
影响因子：
9.9
通讯作者：
ISRAELAC.JN
中科院分区：
文献类型：
--
作者：
ISRAELAC.JN
本文介绍了一种测量夹在两个透明可变形薄片之间的薄膜厚度和折射率分布的光学干涉方法。静态和动态测量都可以进行，该方法最适合于研究厚度从零到几千埃的非常薄的薄膜（厚度分辨率为100埃）。一些实验被困的液体膜和单分子膜的描述来说明该方法。
An optical interference method is described for measuring thickness and refractive index profiles of thin films trapped between two transparent deformable sheets. Both static and dynamic measurements may be made.The method is most suitable for studying very thin films whose thicknesses range from zero to a few thousand angstroms (thickness resolution ∼1 Å). Some experiments on trapped liquid films and monolayers are described to illustrate the method.