Characterization of High-Temperature Oxide Films on Stainless Steels by Electrochemical-Impedance Spectroscopy
Characterization of High-Temperature Oxide Films on Stainless Steels by Electrochemical-Impedance Spectroscopy
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DOI：
10.1023/a:1018856808917
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发表时间：
1998-12
影响因子：
2.2
通讯作者：
J. Pan;C. Leygraf;R. Jargelius-Pettersson;J. Lindén
中科院分区：
文献类型：
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作者：
J. Pan;C. Leygraf;R. Jargelius-Pettersson;J. Lindén
采用电化学阻抗谱（EIS）对三种不锈钢（UNS S30403、S44600、S30815）在800°C空气中形成的氧化膜进行了表征。用三电极电化学池和0.1MNa_2SO_4溶液作电化学阻抗谱，研究了氧化1 ~ 1000小时膜的演变与氧化时间的关系。用两层模型解释了光谱，得到的电容和电阻与薄膜的厚度（或粗糙度）和缺陷有关。结果表明，S30403上的氧化层生长并成为缺陷，S44600上的氧化层迅速增厚并保持较长时间的保护性，而S30815上的氧化层保持薄且电阻性。SEM/EDS表面表征和辉光放电发射光谱（GDOES）得到的氧化膜深度分布支持双层模型。
Oxide films formed on three stainless steels(UNS S30403; S44600; S30815) in air at 800°C werecharacterized by electrochemical-impedance spectroscopy(EIS). The film evolution vs. oxidation time wasinvestigated from 1 to 1000 hr. A three-electrodeelectrochemical cell and 0.1 MNa2SO4solution were employed forEIS measurements. The spectra were interpreted in termsof a two-layer model of the films, where the capacitance and resistance obtained can berelated to the thickness (or roughness) anddefectiveness of the films. The results reveal that theoxide on S30403 grows and becomes defective, the oxideon S44600 thickens rapidly and retains its protectiveability for a relatively long time, and the oxide onS30815 remains thin and resistive. The two-layer modelis supported by surface characterization with SEM/EDS and in-depth profile of the oxide filmsobtained through glow discharge optical emissionspectroscopy (GDOES).