Nonvolatile memory thin-film transistors using an organic ferroelectric gate insulator and an oxide semiconducting channel
Nonvolatile memory thin-film transistors using an organic ferroelectric gate insulator and an oxide semiconducting channel
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DOI:
10.1088/0268-1242/26/3/034007
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发表时间:
2011-02
影响因子:
1.9
通讯作者:
Sung‐Min Yoon;Shinhyuk Yang;C. Byun;Soon-Won Jung;M. Ryu;S. Park;Byeonghoon Kim;Himchan Oh;Chi-Sun Hwang;B. Yu
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文献类型:
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作者:
Sung‐Min Yoon;Shinhyuk Yang;C. Byun;Soon-Won Jung;M. Ryu;S. Park;Byeonghoon Kim;Himchan Oh;Chi-Sun Hwang;B. Yu
Organic–inorganic hybrid-type nonvolatile memory thin-film transistors using an organic ferroelectric gate insulator and an oxide semiconducting active channel are a very promising solution to the memory devices having both features of low-cost and high-performance, which are embeddable into the next-generation flexible and transparent electronics. In this paper, we discuss some important issues for this proposed device, such as device structure design, process optimization and memory array integration. Promising feasible applications and remaining technology issues to solve were also discussed.