Direct quantification of gold along a single Si nanowire.
Direct quantification of gold along a single Si nanowire.
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DOI：
10.1021/nl801952a
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发表时间：
2008-10
期刊：
影响因子：
10.8
通讯作者：
A. Bailly;O. Renault;N. Barrett;L. Zagonel;P. Gentile;N. Pauc;F. Dhalluin;T. Baron;A. Chabli;J. Cezar;N. Brookes
中科院分区：
文献类型：
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作者：
A. Bailly;O. Renault;N. Barrett;L. Zagonel;P. Gentile;N. Pauc;F. Dhalluin;T. Baron;A. Chabli;J. Cezar;N. Brookes
使用能量过滤光电子发射显微镜从核心级纳米光谱直接量化锥形单硅纳米线侧壁上金的存在。确定为0.42+/-0.06（约1.8 ML）的金的均匀岛型部分覆盖与通过扫描电子显微镜观察到的金催化剂的直径减小定量一致，并且通过从侧壁收集的光阈值的分裂来确认，其中使用完整的二次电子分布的模型来提取特征局部功函数。
The presence of gold on the sidewall of a tapered, single silicon nanowire is directly quantified from core-level nanospectra using energy-filtered photoelectron emission microscopy. The uniform island-type partial coverage of gold determined as 0.42+/-0.06 (approximately 1.8 ML) is in quantitative agreement with the diameter reduction of the gold catalyst observed by scanning electron microscopy and is confirmed by a splitting of the photothresholds collected from the sidewall, from which characteristic local work functions are extracted using a model of the full secondary electron distributions.