Turn-to-Turn Contact Resistance Measurement of No-Insulation REBCO Pancake Coils

Turn-to-Turn Contact Resistance Measurement of No-Insulation REBCO Pancake Coils
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DOI:
10.1109/tasc.2019.2903643
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发表时间:
2019-03
影响因子:
1.8
通讯作者:
S. Noguchi;Ryousuke Miyao;Haruyoshi Okusa;Takahiro Tatsuta;H. Ueda;S. Kim
S. Noguchi;Ryousuke Miyao;Haruyoshi Okusa;Takahiro Tatsuta;H. Ueda;S. Kim
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
S. Noguchi;Ryousuke Miyao;Haruyoshi Okusa;Takahiro Tatsuta;H. Ueda;S. Kim

文献摘要

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匝间接触电阻(特性电阻)是影响无绝缘(NI) (RE)Ba$_2$ Cu$_3O_y$ (REBCO)煎饼线圈性能的重要因素。对NI REBCO烧饼线圈的稳定性和充电延时进行了研究。但是,普通的突然放电法无法测量工作电流、温度、外加磁场等不同条件下的匝间接触电阻。虽然NI REBCO线圈匝间接触条件受线圈内压力的影响较大,但要评价NI REBCO线圈的稳定性,必须明确接触电阻的特性。本文提出了一种利用交流电流测量匝间接触电阻的新方法。最后给出了理论和测量结果。与普通突然放电法测得的接触电阻相比,所测得的匝间接触电阻是合理的。在不久的将来,我们将使用该方法测量不同条件下的匝间接触电阻。
The turn-to-turn contact resistance (characteristic resistance) is a very important factor to a no-insulation (NI) (RE)Ba$_2$ Cu$_3O_y$ (REBCO) pancake coil. It characterizes the stability and charging delay of NI REBCO pancake coils. However, the ordinary sudden-discharging method cannot measure the turn-to-turn contact resistance under different conditions, such as an operating current, a temperature, and an external magnetic field. Although the turn-to-turn contact condition is strongly affected by the pressure inside of the NI REBCO coils, the feature of the contact resistance must be clarified to estimate the stability of NI REBCO coils. In this paper, we have proposed a new method to measure the turn-to-turn contact resistance applying ac current. The theory and the measurement results are also shown. The measured turn-to-turn contact resistance is reasonable, compared with that measured by the ordinary sudden-discharging method. In near future, we will measure the turn-to-turn contact resistance under different conditions by means of the proposed method.