Auger-electron spectroscopy as a local probe of atomic charge: SiL/sub 2. 3/VV
Auger-electron spectroscopy as a local probe of atomic charge: SiL/sub 2. 3/VV
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俄歇电子能谱作为原子电荷的局部探针：SiL/sub 2. 3/VV
DOI：
10.1103/physrevlett.40.807
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发表时间：
1978
期刊：
影响因子：
--
通讯作者：
D. R. Jennison
中科院分区：
文献类型：
--
作者：
D. R. Jennison
俄歇电子能谱被证明测量的东西与光电发射完全不同：原子（而不是重叠）电荷分布在整个价带。虽然在s-p带材料中必须考虑矩阵元素效应，但将其包含在计算中仍然导致与实验不一致。然而，如果将电子电荷分为原子和重叠（成键）LCAO分量，并注意到后者对俄歇电流没有贡献，则可以获得良好的一致性。
Auger-electron spectroscopy is shown to measured something quite different from photoemission: the distribution of atomic (as opposed to overlap) charge populations across the valence bands. While matrix-elements effects must be considered in s-p band materials, their inclusion in calculations still lead to poor agreement with experiment. Good agreement may obtained, however, if one divides the electronic charge into atomic and overlap (bonding) LCAO components and notes that the latter does not contribute to the Auger current.