High-order birefringence and dispersion measurement using spectroscopy of polarized light
High-order birefringence and dispersion measurement using spectroscopy of polarized light
复制标题
使用偏振光光谱测量高阶双折射和色散
DOI：
10.1117/12.427032
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发表时间：
2001
期刊：
影响因子：
--
通讯作者：
T. Yoshizawa
中科院分区：
文献类型：
--
作者：
T. Wakayama;H. Kowa;Y. Otani;N. Umeda;T. Yoshizawa
本文介绍了一种测量高阶方位二维延迟和色散的方法和装置。该系统由白色光源、正交偏振片和分光偏振光检测器组成。光谱干涉图的波数变化呈正弦曲线，由于双折射的色散，其周期变化很小。利用傅里叶变换方法从干涉图中分析了双折射的存在。128组图像用于双折射分析。给出了二维双折射随色散的分布的一些结果。
This paper describes a method and device for measurement of two-dimensional retardance and dispersion with high-order and azimuthal direction. The system consists of a white light source, crossed polarizers and a detector for spectroscopic polarized light. A spectroscopic interferogram shows sinusoidal to wave number change, and its period changes slightly because of dispersion of birefringence. Fourier transform method is used to analyze the birefringence from the spectroscopic interferogram. One hundred and twenty-eight sets of images are used for birefringence analysis. Some results of 2D birefringence distribution with dispersion are shown for the demonstration.