Asymmetric structure analysis of active surface-sites by in situ polarized total-reflection fluorescence EXAFS
Asymmetric structure analysis of active surface-sites by in situ polarized total-reflection fluorescence EXAFS
复制标题
原位偏振全反射荧光 EXAFS 分析活性表面位点的不对称结构
DOI:
10.1007/bf00772603
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发表时间:
1993
影响因子:
2.8
通讯作者:
Y. Iwasawa
中科院分区:
文献类型:
--
作者:
K. Asakura;M. Shirai;Y. Iwasawa
An in situ polarization-dependent total reflection fluorescence yield EXAFS system has been developed to analyze the asymmetric structures of catalytically active metal sites on single crystal surfaces. This technique separately reveals the bonding feature parallel and perpendicular to the support surface. The systems of Cu ion on α-quartz(0001), Co oxide on α-alumina(0001), and Pt4 on α-alumina(0001) were investigated as model surfaces of supported catalytic systems. The location of Cu sites on α-quartz(0001), the epitaxial growth mode of Co3O4 on α-alumina(0001), and the Pt raft structure with metal-support interaction in Pt4 / α-alumina(0001) were observed.