An EUV imaging spectrograph for high-resolution observations of the solar corona
An EUV imaging spectrograph for high-resolution observations of the solar corona
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用于高分辨率观测日冕的 EUV 成像光谱仪
DOI：
10.1007/bf00146577
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发表时间：
1992
期刊：
影响因子：
--
通讯作者：
W. Thompson
中科院分区：
文献类型：
--
作者：
W. Neupert;G. L. Epstein;R. Thomas;W. Thompson
已研制出波长范围为235至450埃的极紫外成像摄谱仪，用于太阳的高分辨率观测。该仪器采用了掠入射沃尔特II型望远镜和近垂直入射环形光栅摄谱仪，以实现在此光谱范围内的近像散性能。摄谱仪入口孔径的设计使得能够同时获得光谱分辨率足以观察发射线轮廓的消像散光谱和太阳受限部分的太阳分光日光图。在本文中，我们描述的仪器的设计和性能，并提供了一个概述的结果，在探空火箭飞行于1989年5月5日。
An extreme ultraviolet (EUV) imaging spectrograph for the wavelength range from 235 to 450 Å has been developed and used for high resolution observations of the Sun. The instrument incorporates a glancing incidence Wolter Type II Telescope and a near-normal incidence toroidal grating spectrograph to achieve near-stigmatic performance over this spectral range. The design of the spectrograph entrance aperture enables both stigmatic spectra with spectral resolution adequate to observe emission line profiles and spectroheliograms of restricted portions of the Sun to be obtained concurrently. In this paper we describe the design and performance of the instrument and provide an overview of results obtained during a sounding rocket flight on May 5, 1989.