Topmetal-M: A novel pixel sensor for compact tracking applications
Topmetal-M: A novel pixel sensor for compact tracking applications
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Topmetal-M:用于紧凑型跟踪应用的新型像素传感器
DOI:
10.1016/j.nima.2020.164557
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发表时间:
2020
期刊:
影响因子:
--
通讯作者:
Xiangming S
中科院分区:
文献类型:
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作者:
Weiping Ren;Wei Zhou;Bihui You;Ni Fang;Yan Wang;Haibo Yang;Honglin Zhang;Yao Wang;Jun Liu;Xianqin Li;Ping Yang;Le Xiao;Yuezhao Zhang;Xiangru Qu;Shuguang Zou;Guangming Huang;Hua Pei;Fan Shen;Dong Wang;Xiaoyang Niu;Yuan Mei;Yubo Han;Chaosong Gao;Xiangming S
The Topmetal-M is a large area pixel sensor (18 mm× 23 mm) prototype fabricated in a new 130 nm high-resistivity CMOS process in 2019. It contains 400 rows× 512 columns square pixels with the pitch of 40 μ m. In Topmetal-M, a novel charge collection method combining the Monolithic Active Pixel Sensor (MAPS) and the Topmetal sensor has been proposed for the first time. Both the ionized charge deposited by the particle in the sensor and along the track over the sensor can be collected. The in-pixel circuit mainly consists of a low-noise charge sensitive amplifier to establish the signal for the energy reconstruction, and a discriminator with a Time-to-Amplitude Converter (TAC) for the Time of Arrival (TOA) measurement. With this mechanism, the trajectory, particle hit position, energy, and arrival time of the particle can be measured. The analog signal from each pixel is accessible through time-shared multiplexing over the entire pixel array. This paper will discuss the design and preliminary test results of the Topmetal-M sensor.