Continuous Phase Control of Vanadium Dioxide Films
Continuous Phase Control of Vanadium Dioxide Films
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DOI：
10.1115/1.4046929
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发表时间：
2020-09
影响因子：
1.7
通讯作者：
Jiguo Dai;Chandika Annasiwatta;A. Bernussi;Zhaoyang Fan;J. Berg;B. Ren
中科院分区：
文献类型：
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作者：
Jiguo Dai;Chandika Annasiwatta;A. Bernussi;Zhaoyang Fan;J. Berg;B. Ren
二氧化钒（VO 2）在大约68 ℃经历金属-绝缘体转变（MIT），其物理性质（例如，光学、电学和机械）性能。这种行为使得VO 2薄膜在许多潜在的应用中具有重要意义，包括存储器件、开关、传感器和光调制器。对于ON/OFF之类的数字应用，突然切换行为是理想的。然而，为了连续地改变VO 2金属/绝缘体相位比以进行类似操作，VO 2 MIT的固有滞后特性使得相位控制成为一个艰巨的挑战。本文研究了通过连续改变相位比来控制和跟踪期望的光学透过率的问题。当考虑到单个薄膜样品的差异以及在窄的温度范围内与相变相关联的滞后时，问题变得更糟。本文提出了一种基于不确定性和扰动估计器（UDE）结构的鲁棒反馈控制器。所提出的控制器是能够减轻滞后的不利影响，同时也补偿各种不确定性。所提出的方法的有效性与实验验证证明。[DOI 10.1115/1.4046929]
Vanadium dioxide (VO2) undergoes a metal-insulator transition (MIT) at approximately 68 C, with associated sharp changes in its physical (e.g., optical, electrical, and mechanical) properties. This behavior makes VO2 films of interest in many potential applications, including memory devices, switches, sensors, and optical modulators. For ON/OFF like digital applications, an abrupt switching behavior is ideal. However, to continuously change VO2 metal/insulator phase ratio for analog-like operation, the intrinsic hysteresis characteristic of VO2 MIT renders the phase control becoming a formidable challenge. This paper considers the problem of controlling and tracking desired optical transmittance via continuous phase ratio change. The problem becomes worse while considering the differences of individual thin-film samples and the hysteresis associated with the phase change within a narrow temperature range. This paper reports a robust feedback controller using an optical transmittance measurement and based on an uncertainty and disturbance estimator (UDE) architecture. The proposed controller is capable of mitigating the adverse effect of hysteresis, while also compensating for various uncertainties. The effectiveness of the proposed methodology is demonstrated with experimental validation. [DOI: 10.1115/1.4046929]