Uncertainty and its Reduction of Voltage Waveform Induced on Trace on Printed Circuit Board for Indirect Discharges from ESD-Gun onto Vertical Coupling Plane
Uncertainty and its Reduction of Voltage Waveform Induced on Trace on Printed Circuit Board for Indirect Discharges from ESD-Gun onto Vertical Coupling Plane
复制标题
静电枪向垂直耦合平面间接放电印刷电路板上迹线感应电压波形的不确定性及其降低
DOI：
10.1541/ieejfms.130.253
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发表时间：
2010
影响因子：
--
通讯作者：
O. Fujiwara
中科院分区：
文献类型：
--
作者：
N. Yamamoto;Y. Taka;O. Fujiwara
国际电工委员会（IEC）规定了电子设备对静电放电（esd）的抗扰度测试（IEC610000-4-2），并规定了从静电枪到被测设备（EUT）附近垂直耦合平面（VCP）上的间接放电，以模拟人员对靠近EUT的导电材料的放电。根据IEC 61000-4-2 2001-04的规定，VCP应放置在与EUT相距0.1m的位置，并且防静电枪的间接放电应在VCP垂直边缘的中心，而EUT的参考布置以及防静电枪的倾斜和旋转角度没有具体确定。为了弄清EUT安排对测试结果的影响程度，我们使用一个简单的印刷电路板（PCB）代替EUT，测量了不同倾斜角度和旋转角度的ESD枪间接放电时在迹线上产生的电压。结果，我们发现间接放电到VCP垂直边缘的中心时，感应电压峰值的变化是1.7倍，而间接放电到VCP的背面垂直边缘时，峰值电压的不确定性降低了±5%。后一项发现提供了一种间接放电到VCP的新方法，其测试结果不太可能受到EUT安排的影响。
International Electrotechnical Commission (IEC) prescribes immunity tests (IEC610000-4-2) of electronic equipment against electrostatic discharges (ESDs), and specifies indirect discharges from an ESD-gun onto a vertical coupling plane (VCP) in the vicinity of equipment under test (EUT) for simulating personnel discharges to conductive materials being adjacent to the EUT. According to IEC 61000-4-2 2001-04, the VCP shall be placed at a distance of 0.1m from the EUT, and the indirect discharge of an ESD-gun should be conducted to the centre of a vertical edge of the VCP, while the reference arrangement of EUT and the angles of inclination and rotation of the ESD-gun are not specifically determined. In order to clarify to what extent EUT arrangements affect test results, using a simple printed circuit board (PCB) with a trace in lieu of EUT, we measured the voltages induced on the trace for indirect discharges from an ESD gun with different angles of inclination and rotation. As a result, we found that the peaks of induced voltages vary by a factor of 1.7 for indirect discharges onto the centre of a vertical edge of a VCP, while the indirect discharges onto the vertical edge from the back side of a VCP reduce the uncertainty of peak voltages by ±5%. The latter finding provides a new method for indirect discharges onto a VCP, whose test results are unlikely to be affected by EUT arrangements.