Two-wavelength laser-diode interferometer with fractional fringe techniques.
Two-wavelength laser-diode interferometer with fractional fringe techniques.
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DOI：
10.1364/ao.34.004740
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发表时间：
1995-08
期刊：
影响因子：
1.9
通讯作者：
R. Onodera;Y. Ishii
中科院分区：
文献类型：
--
作者：
R. Onodera;Y. Ishii
使用双频率斜坡激光二极管构建了采用分数条纹技术（重合法）的双波长干涉仪。通过外差技术测量两个光学相位各自的波长。检测到的两个相位被用于实时电子处理，以产生与单个波长处的整数和分数条纹数相对应的两个信号。这些求和信号可以产生具有单波长分辨率的合成相。从理论上分析了测量精度的上限。
A two-wavelength interferometer with a fractional fringe technique (the method of coincidence) has been constructed by using dual frequency-ramped laser diodes. The respective wavelengths of two optical phases were measured by the heterodyne technique. The detected two phases are employed with real-time electronic processing to produce two signals that correspond to the integer and the fractional fringe numbers at a single wavelength. These summed signals can yield a synthetic phase having a single-wavelength resolution. The upper limits for the measurement accuracy are theoretically analyzed.