Combined scanning electrochemical atomic force microscopy for tapping mode imaging
Combined scanning electrochemical atomic force microscopy for tapping mode imaging
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DOI：
10.1063/1.1559652
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发表时间：
2003-03-01
影响因子：
4
通讯作者：
Bertagnolli, E
中科院分区：
文献类型：
--
作者：
Kueng, A;Kranz, C;Bertagnolli, E
随着使用微细加工技术将亚微米和纳米电极集成到原子力显微镜（AFM）尖端中，最近已经证明了一种将扫描电化学显微镜（SECM）与原子力显微镜相结合的优雅方法。同时成像的形貌和电化学在样品表面的AFM轻敲模式与集成的SECM-AFM杠杆振荡或附近的共振频率。与接触模式AFM成像相反，样品表面处的摩擦力被最小化。因此，软表面的形貌和电化学信息（例如，生物物种）。(C)2003年，美国物理学会。
With the integration of submicro- and nanoelectrodes into atomic force microscopy (AFM) tips using microfabrication techniques, an elegant approach combining scanning electrochemical microscopy (SECM) with atomic force microscopy has recently been demonstrated. Simultaneous imaging of topography and electrochemistry at a sample surface in AFM tapping mode with integrated SECM-AFM cantilevers oscillated at or near their resonance frequency is shown. In contrast to contact mode AFM imaging frictional forces at the sample surface are minimized. Hence, topographical and electrochemical information of soft surfaces (e.g., biological species) can be obtained. (C) 2003 American Institute of Physics.