Ionization Temperatures in the Inductively Coupled Plasma Determined by Mass Spectrometry
Ionization Temperatures in the Inductively Coupled Plasma Determined by Mass Spectrometry
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通过质谱法测定电感耦合等离子体中的电离温度
DOI：
10.1366/0003702874448139
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发表时间：
1987
期刊：
影响因子：
--
通讯作者：
G. Hieftje
中科院分区：
文献类型：
--
作者：
Daniel A. Wilson;G. H. Vickers;G. Hieftje
在电感耦合等离子体中的电离温度确定与使用的电离分数碘通过质谱采样获得。在相对较低的高度，在不同的高度和不同的位置，整个等离子体的温度分布在6900和7800 K之间。功率增加会提高测量的电离温度，而雾化器气流的变化和向等离子体中添加易电离元素没有可测量的影响。样品气溶胶的去溶剂化导致电离温度降低约500 K。
Ionization temperatures in the inductively coupled plasma are determined with the use of the ionization fraction for iodine obtained by mass-spectral sampling. Temperatures profiled at different heights and different positions across the plasma are between 6900 and 7800 K at relatively low heights. Power increases raise the measured ionization temperature, while changes in nebulizer gas flow and the addition of an easily ionized element to the plasma have no measurable effect. Desolvation of the sample aerosol causes a decrease of about 500 K in the ionization temperature.