An Accurate Statistical Yield Model for CMOS Current-Steering D/A Converters
An Accurate Statistical Yield Model for CMOS Current-Steering D/A Converters
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DOI：
10.1109/iscas.2000.858699
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发表时间：
2000-05
影响因子：
1.4
通讯作者：
A. Bosch;M. Steyaert;W. Sansen
中科院分区：
文献类型：
--
作者：
A. Bosch;M. Steyaert;W. Sansen
为了获得高精度的电流舵型数模转换器，电流源晶体管的匹配行为是设计中的关键问题之一。此时，通过使用耗时和CPU密集的蒙特卡罗模拟来考虑这些匹配特性。本文在不损失设计时间的前提下，推导出了准确描述失配对电流型D/A转换器INL(积分非线性)成品率影响的公式。
To obtain a high resolution CMOS current-steering digital-to-analog converter, the matching behavior of the current source transistors is one of the key issues in the design. At this moment, these matching properties are taken into account by the use of time consuming and CPU intensive Monte Carlo simulations. In this paper, a formula is derived that describes accurately the impact of the mismatch on the INL (integral non-linearity) yield of current-steering D/A converters without any loss of design time.