Electron-Induced Decomposition of Condensed Acetone Studied by Quantifying Desorption and Retention of Volatile Products

Electron-Induced Decomposition of Condensed Acetone Studied by Quantifying Desorption and Retention of Volatile Products
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通过量化挥发性产物的解吸和保留来研究缩合丙酮的电子诱导分解

DOI:
10.1021/acs.jpcc.5b01167
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发表时间:
2015
影响因子:
3.7
通讯作者:
P. Swiderek
P. Swiderek
中科院分区:
化学3区
文献类型:
--
作者:
J. Warneke;P. Swiderek

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通过电子激发脱附(ESD)实验和热脱附谱(TDS)监测丙酮的衰变和挥发产物的形成,研究了丙酮凝聚层的电子诱导分解。提出了衰变的反应机理,并根据得到的一组基本速率方程对TDS和ESD数据进行了模拟,验证了其有效性。结果表明,ESD数据作为电子暴露的函数也提供了非挥发性物质存在的间接证据。特别是,CO的形成和脱附被延迟,因为部分羰基被并入较大的非挥发性化合物中。反过来,当进一步的电子暴露释放CO时,这些物质会分解。在小挥发性产物CO和CH4的脱附温度以下获得的ESD曲线也得到了很好的再现,假设丙酮层吸收挥发性物质的能力有限,并在分解过程中被这些产物饱和。最后,我们表明,在小挥发性产物的脱附温度以上和以下获得的ESD数据的定量评估原则上提供了一种定量比较ESD和辐射后TDS中解吸产物量的方法。
The electron-induced decomposition of thin condensed layers of acetone was studied by a combination of electron-stimulated desorption (ESD) experiments and thermal desorption spectrometry (TDS) monitoring both the decay of acetone and the formation of volatile products. A reaction mechanism for the decay is proposed and its validity verified by modeling the TDS and ESD data on the basis of a set of resulting elementary rate equations. The results show that ESD data as a function of electron exposure also give indirect evidence of the presence of nonvolatile species. In particular, formation and desorption of CO is delayed because part of the carbonyl groups become incorporated in larger nonvolatile compounds. These, in turn, decompose upon further electron exposure to release CO. ESD curves obtained below the desorption temperature of the small volatile products CO and CH4have also been reproduced well assuming that acetone layers have a limited capacity for uptake of volatile species and become saturated with these products during decomposition. Finally, we show that the quantitative evaluation of ESD data obtained above and below the desorption temperature of small volatile products in principle offers an approach to a quantitative comparison of product amounts desorbing in ESD and postirradiation TDS.
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