Reduced Complexity Attacks on the Alternating Step Generator

Reduced Complexity Attacks on the Alternating Step Generator
复制标题

对交替步进发生器的降低复杂性攻击

DOI:
10.1007/978-3-540-77360-3_1
复制
发表时间:
2007
期刊:
Microelectron. J.
影响因子:
--
通讯作者:
W. Meier
W. Meier
中科院分区:
--
文献类型:
--
作者:
Shahram Khazaei;Simon Fischer;W. Meier

文献摘要

被引文献

相似文献

在本文中,我们介绍了对交替步骤生成器(ASG)的一些复杂性攻击。攻击基于一个相当一般的框架,主要受益于ASG的低采样电阻,以及与停止/GO LFSR初始状态的分布相关的异常行为,该行为产生了输出序列的给定段。我们的结果与先前的结果相比,因为它们在ASG的已知输出方面表现出更大的灵活性,而ASG的复杂性降低。我们还将为[13]中提出的对ASG(和SG)的攻击的复杂性提供封闭形式。
In this paper, we present some reduced complexity attacks on the Alternating Step Generator (ASG). The attacks are based on a quite general framework and mostly benefit from the low sampling resistance of the ASG, and of an abnormal behavior related to the distribution of the initial states of the stop/go LFSR's which produce a given segment of the output sequence. Our results compare well with previous results as they show a greater flexibility with regard to known output of the ASG, which amounts in reduced complexity. We will also give a closed form for the complexity of attacks on ASG (and SG) as presented in [13].