Single-hit resolution measurement with MEG II drift chamber prototypes

Single-hit resolution measurement with MEG II drift chamber prototypes
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使用 MEG II 漂移室原型进行单次分辨率测量

DOI:
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发表时间:
2016
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通讯作者:
C. Voena
C. Voena
中科院分区:
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文献类型:
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作者:
A. Baldini;E. Baracchini;G. Cavoto;M. Cascella;F. Cei;M. Chiappini;G. Chiarello;C. Chiri;S. Dussoni;L. Galli;F. Grancagnolo;M. Grassi;V. Martinelli;D. Nicoló;M. Panareo;A. Pepino;G. Piredda;F. Renga;E. Ripiccini;G. Signorelli;G. Tassielli;F. Tenchini;M. Venturini;C. Voena

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用氦基气体混合物操作的漂移室是跟踪带电粒子的常用解决方案,可以将敏感体积中的材料预算保持在最低限度。这种解决方案的缺点是由于初级电离波动导致空间分辨率的恶化,这是高粒度漂移室(如MEG II跟踪器)的限制因素。我们报告了在三种不同的MEG II漂移室原型上进行的测量,旨在确定可实现的单命中分辨率。原型机在氦/异丁烷混合气体中运行,并暴露在宇宙射线、电子束和放射源中。使用外部跟踪器进行的单次命中分辨率的直接测量返回值为110 μm,与使用其他原型进行的间接测量获得的值一致。
Drift chambers operated with helium-based gas mixtures represent a common solution for tracking charged particles keeping the material budget in the sensitive volume to a minimum. The drawback of this solution is the worsening of the spatial resolution due to primary ionisation fluctuations, which is a limiting factor for high granularity drift chambers like the MEG II tracker. We report on the measurements performed on three different prototypes of the MEG II drift chamber aimed at determining the achievable single-hit resolution. The prototypes were operated with helium/isobutane gas mixtures and exposed to cosmic rays, electron beams and radioactive sources. Direct measurements of the single hit resolution performed with an external tracker returned a value of 110 μm, consistent with the values obtained with indirect measurements performed with the other prototypes.