Temperature Dependences of Spin-Diffusion Lengths of Cu and Ru layers
Temperature Dependences of Spin-Diffusion Lengths of Cu and Ru layers
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DOI：
10.1143/jjap.45.3892
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发表时间：
2006-05
影响因子：
1.5
通讯作者：
S. Yakata;Y. Ando;T. Miyazaki;S. Mizukami
中科院分区：
文献类型：
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作者：
S. Yakata;Y. Ando;T. Miyazaki;S. Mizukami
测量了不同d值的Cu/Ni_（80）Fe_（20）/normal-metal：NM（d）/Pt，Cu/Ni_（80）Fe_（20）/NM（d）薄膜的铁磁共振（FMR），以阐明由磁化旋进引起的自旋扩散长度与吉尔伯特阻尼的温度关系。薄膜采用射频磁控溅射法制备。利用Landau-Lifshitz-吉尔伯特方程分析了铁磁共振共振场和线宽的离面角依赖关系，得到了NiFe的吉尔伯特阻尼参数G。在300和4.5 K下，自旋扩散长度λSD分别为350和950 nm。利用铁磁共振线宽随温度的变化关系，得到了铜层的自旋反转几率。这些结果进行了比较与自旋扩散长度的温度依赖性的计算数据。
Ferromagnetic resonance (FMR) was measured in Cu/Ni80Fe20/normal-metal: NM (d)/Pt, Cu/Ni80Fe20/NM (d) films with various d values to clarify the temperature dependence of spin-diffusion length induced by the precession of magnetization on Gilbert damping. The films were fabricated by rf magnetron sputtering. The out-of-plane angular dependences of FMR resonance field and linewidth were analyzed using a Landau–Lifshitz–Gilbert equation, and the Gilbert damping parameter G of NiFe was obtained. The obtained spin-diffusion lengths λSD were 350 and 950 nm at 300 and 4.5 K, respectively. The spin-flip probability of the Cu layer was obtained using the temperature dependence of FMR linewidth. These results were then compared with the calculated data of the temperature dependence of spin-diffusion length.