Dynamic Testing Strategy for Distributed Systems

Dynamic Testing Strategy for Distributed Systems
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分布式系统的动态测试策略

DOI:
10.1109/12.21122
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发表时间:
1989
期刊:
IEEE Trans. Computers
影响因子:
--
通讯作者:
D. Pradhan
D. Pradhan
中科院分区:
--
文献类型:
--
作者:
F. Meyer;D. Pradhan

文献摘要

被引文献

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故障诊断被视为两个不同的过程:故障发现和诊断信息的传播。以前的研究确定了什么水平的自诊断性的一组给定的测试在同构系统中实现,使用的模型中,只有节点故障发生和测试覆盖是完整的。采用相同的模型,提出了一种新的方法,最大限度地减少与周期性测试,从而降低测试开销。该方法诊断高达c-.1故障(c是系统拓扑的连通性)。当处理器故障率较低时,测试中的节省是有效的。还检查了具有高处理器故障率的环境。结果表明,采用所提出的方法,这样的系统的结果在更大的可靠性,同时保持相同的有效处理能力。>
Fault diagnosis is treated as two distinct processes: fault discovery and dissemination of diagnostic information. Previous research determined what level of self-diagnosability a given set of test in a homogeneous system achieves, using a model in which only node failures occur and test coverage is complete. Adopting the same model, a new methodology is presented that minimizes the overhead associated with periodic testing, thus lowering testing overhead. The method diagnoses up to c-.1 faults (c is the connectivity of the system topology). The savings in testing is valid when processor failure rates are low. Environments are also examined with high processor failure rates. It is shown that adopting the proposed methodology for such systems results in greater reliability, while maintaining the same effective processing power. >