Antireflective Coating Design of Spherical Silicon Solar Cell with Reflector Cup by Ray-Tracing Simulation
Antireflective Coating Design of Spherical Silicon Solar Cell with Reflector Cup by Ray-Tracing Simulation
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光线追迹模拟设计球形硅太阳电池反射杯减反射涂层
DOI：
10.1143/jjap.44.8345
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发表时间：
2005
期刊：
影响因子：
--
通讯作者：
Y. Hamakawa
中科院分区：
文献类型：
--
作者：
T. Minemoto;T. Ikuta;H. Takakura;Y. Hamakawa
采用三维射线追踪模拟方法，对带反射杯的球形硅太阳能电池增透膜的优化设计进行了分析。由于入射光在太阳能电池表面的角度分布，需要进行三维光线追踪来估计短路电流密度。在模拟中，太阳能电池由一个直径为1mm的球形硅太阳能电池和一个孔径为2mm的半球形反射杯组成，表面覆盖一层无表面纹理的AR涂层。计算了AR涂层厚度(t)和折射率(n)与Jsc的关系，结果表明，在t=78 nm, n=2.0时，最佳的Jsc为39.7 mA/cm2。此外，AR涂层的光学膜厚度具有更高的设计公差，这对于球形硅太阳能电池尤其有利，因为球形硅太阳能电池固有地在均匀AR涂层形成方面存在一些技术困难。
An optimum design of an antireflective (AR) coating for a spherical Si solar cell with a reflector cup has been analyzed with a three-dimensional (3D) ray-tracing simulation. The 3D ray tracing is required to estimate the short-circuit current density (Jsc) because of an incident light angle distribution on a solar cell surface. In the simulation, the solar cell consists of a spherical Si solar cell with a diameter of 1 mm covered by an AR coating without surface texturing, and a hemispherical reflector cup with an aperture of 2 mm. The calculations of AR coating thickness (t) and refractive index (n) dependences on Jsc revealed that an optimum Jsc of 39.7 mA/cm2 can be obtained at t=78 nm and n=2.0. Also, a higher design tolerance in an optical film thickness of the AR coating is demonstrated, which is especially advantageous for spherical Si solar cells which inherently have some technical difficulties in a uniform AR coating formation.