Direct observation for atomically flat and ordered vertical {111} side-surfaces on three-dimensionally figured Si(110) substrate using scanning tunneling microscopy
Direct observation for atomically flat and ordered vertical {111} side-surfaces on three-dimensionally figured Si(110) substrate using scanning tunneling microscopy
复制标题
使用扫描隧道显微镜直接观察三维图形 Si(110) 衬底上原子级平坦且有序的垂直 {111} 侧表面
DOI：
10.7567/jjap.56.111301
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发表时间：
2017
影响因子：
1.5
通讯作者：
Tanaka Hidekazu
中科院分区：
文献类型：
--
作者：
Yang Haoyu;Hattori Azusa N.;Ohata Akinori;Takemoto Shohei;Hattori Ken;Daimon Hiroshi;Tanaka Hidekazu
