Degradation and recovery of polarization under synchrotron x rays in SrBi2Ta2O9 ferroelectric capacitors
Degradation and recovery of polarization under synchrotron x rays in SrBi2Ta2O9 ferroelectric capacitors
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DOI：
10.1063/1.1851598
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发表时间：
2005-01
影响因子：
3.2
通讯作者：
N. Menou;A. Castagnos;C. Muller;D. Goguenheim;L. Goux;D. Wouters;J. Hodeau;E. Dooryhee;R. Barrett
中科院分区：
文献类型：
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作者：
N. Menou;A. Castagnos;C. Muller;D. Goguenheim;L. Goux;D. Wouters;J. Hodeau;E. Dooryhee;R. Barrett
用高亮度同步辐射x射线衍射对初等Pt / SrBi2Ta2O9 / Pt铁电电容器进行了结构表征。通过收集高质量的一维和二维衍射图，对堆叠层进行了微观结构分析。在x射线衍射实验中，证实了辐照下的特殊电学行为。事实上，根据其初始状态（极化或非极化），电容器在辐照后或辐照下的电特性发生了巨大变化，观察到“类疲劳”（极化减少）和∕或“类印记”（电压移动）现象。利用专门设计的样品环境原位测量铁电特性的演变，分析了srbi2ta2o9基电容器在x射线辐射下铁电性能退化和恢复的动力学。可调极化的减小和恢复已成为
Elementary Pt∕SrBi2Ta2O9∕Pt ferroelectric capacitors have been structurally characterized by x-ray diffraction using highly brilliant synchrotron radiation. A microstructural analysis of the stacked layers was performed from the collection of high-quality one-dimensional and two-dimensional diffraction patterns. During x-ray diffraction experiments, peculiar electrical behaviors under irradiation were evidenced. Indeed, depending upon their initial state (poled or nonpoled), the capacitors have exhibited drastic changes in their electrical characteristics after or under irradiation, both “fatiguelike” (polarization reduction) and∕or “imprintlike” (voltage shift) phenomena being observed. Using a sample environment specially designed to measure in situ the evolutions of ferroelectric characteristics, the kinetics of both degradation and restoration of ferroelectric properties of the SrBi2Ta2O9-based capacitors under x-ray radiation have been analyzed. Reduction and recovery of switchable polarization have ...