Electromechanical Reliability Testing of Flexible Hybrid Electronics Incorporating FleX Silicon-On-Polymer Ics
Electromechanical Reliability Testing of Flexible Hybrid Electronics Incorporating FleX Silicon-On-Polymer Ics
复制标题
采用 FleX 聚合物硅集成电路的柔性混合电子设备的机电可靠性测试
DOI:
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复制
发表时间:
2016
期刊:
影响因子:
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通讯作者:
D. Hackler
中科院分区:
文献类型:
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作者:
Darrell E. Leber;Brian N. Meek;Seth D. Leija;Dale G. Wilson;Richard L. Chaney;D. Hackler
Flexible Hybrid Electronics combine the best characteristics of printed electronics and silicon ICs to create high performance, ultra-thin, physically flexible systems. New static and dynamic tests are being developed to evaluate the performance of these systems. Dynamic radius of curvature and torsional test results are presented for a flexible hybrid electronics system with a FleX Silicon-on-Polymer operational amplifier manufactured in an 180nm CMOS process with 4-levels of metal interconnect mounted on a PET substrate.