A liquid-xenon-jet laser-plasma X-ray and EUV source
A liquid-xenon-jet laser-plasma X-ray and EUV source
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DOI:
10.1016/s0167-9317(00)00401-9
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发表时间:
2000-06-01
影响因子:
2.3
通讯作者:
Hertz, HM
中科院分区:
文献类型:
--
作者:
Hansson, BAM;Rymell, L;Hertz, HM
We describe a laser-plasma soft-x-ray source based on a cryogenic-xenon liquid-jet target. The source is suitable for extreme ultraviolet (EUV) projection lithography and proximity x-ray lithography (PXL). Absolute calibrated spectra in the 1-2 nm range and uncalibrated spectra in the 9-15 nm range are obtained using a free-standing transmission grating and a CCD-detector.