Guided-wave reflectometry with micrometer resolution.
Guided-wave reflectometry with micrometer resolution.
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具有微米分辨率的导波反射测量。
DOI：
10.1364/ao.26.002836
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发表时间：
1987
期刊：
影响因子：
1.9
通讯作者：
C. Whittenberg
中科院分区：
文献类型：
--
作者：
B. Danielson;C. Whittenberg
介绍了一种用于测试单模光导系统的新型光学反射仪。该技术使用扫描迈克尔逊干涉仪、宽带照明源和互相关检测。高分辨率是通过后向散射辐射的有限相干性来实现的。利用这种方法，可以区分仅相隔几微米的散射中心。在一些情况下，可以估计测试光导的传输路径中的组件的损耗。以全光纤反射计为例，说明了这种诊断技术的基本原理和一些性能特点。我们还讨论了几个实验室应用，以证明这一测量概念的分辨率能力。
We describe a new type of optical reflectometry which is useful in testing single-mode lightguide systems. This technique uses a scanning Michelson interferometer in conjunction with a broadband illuminating source and cross-correlation detection. High resolution is achieved through the limited coherence of the backscattered radiation. With this approach it is possible to distinguish scattering centers separated by only a few micrometers. In some cases loss may be estimated for components in the transmission path of a test lightguide. The basic principles of this diagnostic technique, along with some performance characteristics, are illustrated for an all-fiber reflectometer. We also discuss several laboratory applications which serve to demonstrate the resolution capabilities of this measurement concept.