Studies of Reduced Graphene Oxide and Graphite Oxide in the Aspect of Their Possible Application in Gas Sensors.
Studies of Reduced Graphene Oxide and Graphite Oxide in the Aspect of Their Possible Application in Gas Sensors.
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DOI：
10.3390/s16010103
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发表时间：
2016-01-15
期刊：
影响因子：
--
通讯作者：
Setkiewicz M
中科院分区：
文献类型：
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作者：
Drewniak S;Muzyka R;Stolarczyk A;Pustelny T;Kotyczka-Morańska M;Setkiewicz M
本文介绍了基于氧化石墨（GRO）和氧化石墨烯（rGO）的电阻结构的研究结果。研究的主题是解冻测试结构的灵敏度受氢气、二氧化氮和二氧化碳的影响。实验在30 °C至150 °C的温度范围内在两种载气：氮气和合成空气中进行。测量还旨在表征氧化石墨和氧化石墨烯。在我们的测量中，我们使用了（除其他外）技术，例如：原子力显微镜（AFM）;扫描电子显微镜（SEM）;拉曼光谱（RS）;傅里叶变换红外光谱（FT-IR）和X射线光电子显微镜（XPS）。从氧化石墨和氧化石墨烯的表征得到的数据使得有可能从这些结构中发生的物理化学变化的角度来解释所获得的结果。
The paper presents the results of investigations on resistance structures based on graphite oxide (GRO) and graphene oxide (rGO). The subject matter of the investigations was thaw the sensitivity of the tested structures was affected by hydrogen, nitrogen dioxide and carbon dioxide. The experiments were performed at a temperature range from 30 °C to 150 °C in two carrier gases: nitrogen and synthetic air. The measurements were also aimed at characterization of the graphite oxide and graphene oxide. In our measurements we used (among others) techniques such as: Atomic Force Microscopy (AFM); Scanning Electron Microscopy (SEM); Raman Spectroscopy (RS); Fourier Transform Infrared Spectroscopy (FT-IR) and X-ray Photoelectron Microscopy (XPS). The data resulting from the characterizations of graphite oxide and graphene oxide have made it possible to interpret the obtained results from the point of view of physicochemical changes occurring in these structures.