Riyuu‘Reason’ fornai desuand other semi-polite forms
Riyuu‘Reason’ fornai desuand other semi-polite forms
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Riyuu‘Reason’ fornai desu 和其他半礼貌形式
DOI：
10.1075/pbns.180.00riy
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发表时间：
2008
期刊：
影响因子：
2.1
通讯作者：
M. E. Hudson
中科院分区：
文献类型：
--
作者：
M. E. Hudson
所有日语谓词（系动词、形容词和动词）都显示肯定和否定的区别，并可能出现在“plain”-da/-ru或“polite”-desu/-masu风格中。位于这两种风格之间的是另一种风格，其形式基本上是通过将礼貌的标记添加到普通的对应物中而获得的。[1]让我们把这第三种风格称为“半礼貌”。表1列出了日语中礼貌、半礼貌和普通风格的谓语的屈折变化结尾。本研究考察了日语中的“半礼貌”风格，特别关注动词否定形式，即动词+ nai desu（非过去）和动词+ nakatta desu（过去）。据报道，这种形式的使用在当代日本呈上升趋势，但迄今为止在文献中没有得到太多的关注。对奈德苏和其他半礼貌的文体形式的研究是重要的，因为它关系到语言的更广泛的方面，即敬语的“敬语”，这将在随后的章节中显示。以下，“nai desu form”和“masen form”将被用作涵盖术语，指的是它们的非过去式和过去式变体，沿着术语“semi-polite”和“polite”。Jones，T. Ono和T.万斯和与会者，特别是S。冈本，他的评论使我受益匪浅。我也要感谢T。Tanomura，S. Uehara和E.福岛的援助。这里可能包含的任何错误当然是我自己的。
All Japanese predicates (copulas, adjectives and verbs) display the affirmative-negative distinction and may appear in the ‘plain’-da/-ru or ‘polite’-desu/-masu style. Located in between these two is yet another style, whose forms are basically derived by adding the polite marker-des-u to the plain counterparts. 1 Let us call this third style ‘semipolite.’See Table 1 for the inflectional endings of Japanese predicates in polite, semipolite, and plain styles. 2 e present study examines the ‘semi-polite’style in Japanese, with a particular focus on verbal negatives; that is, verb+ nai desu (nonpast) and verb+ nakatta desu (past). 3 e use of such forms is reported to be on the rise in contemporary Japanese, but has not hitherto received much attention in the literature. An investigation of nai desu and other semi-polite style forms is important as it bears on a broader aspect of the language, namely, keigo ‘honorifics,’as will be shown in subsequent sections. Hereafter,‘nai desu form’and ‘masen form’will be used as cover terms referring to both their nonpast and past tense variants, along with the terms ‘semi-polite’and ‘polite’* My sincere appreciation goes to the organizers of the 2002 Japanese Speech Style Shift Symposium, K. Jones, T. Ono, and T. Vance, and to the participants, especially S. Okamoto, whose comments benefited me greatly. I am also grateful to T. Tanomura, S. Uehara and E. Fukushima for their assistance. Any error that may be contained herein is of course my own.