Single frame coaxial 3D measurement using depth from defocus of projection system
Single frame coaxial 3D measurement using depth from defocus of projection system
复制标题
使用投影系统散焦深度进行单帧同轴 3D 测量
DOI:
10.1117/12.907675
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发表时间:
2012
期刊:
影响因子:
--
通讯作者:
Shigeru Ando
中科院分区:
文献类型:
--
作者:
Toru Kuriahra;Shigeru Ando
We propose 3D profilometry based on depth from defocus of the projection system with the same axis of imaging system. In this system, the stripe pattern generated by DLP Light commander is projected on the object, and it moves on object's surface generating temporal variation of the light intensity. The projected stripe pattern is defocused depending on its distance from the focal plane. By moving the stripe pattern, defocused spatial frequency component is captured by temporal frequency analysis. We use correlation image sensor (CIS) to capture the temporal frequency component in a single frame. CIS outputs the Fourier coefficients of incident light in each pixel for every frames, and therefore it enables single frame 3D measurement. Evaluation experiments show that projection defocus depends on the distance from the focal plane, and it can be used for 3D measurement.