Goniometric and topographic characterization of synthetic IIa diamonds
Goniometric and topographic characterization of synthetic IIa diamonds
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合成 IIa 钻石的测角和形貌特征
DOI：
10.1088/0022-3727/38/10a/012
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发表时间：
2005
期刊：
影响因子：
--
通讯作者：
T. Ishikawa
中科院分区：
文献类型：
--
作者：
K. Tamasaku;T. Ueda;D. Miwa;T. Ishikawa
使用摇摆曲线测量和准平面波入射的 X 射线形貌以及高分辨率倒易空间映射来表征合成 IIa 钻石。 (111)晶体的摇摆曲线与理论曲线相当。由于堆垛层错密度较高，一些晶体具有更宽的摇摆曲线。由于位错和应变带，即使是最高质量的晶体也无法给出理论摇摆曲线。另一方面，(100)晶体具有近乎完美的面积。这种差异归因于晶种的取向。
Synthetic type IIa diamonds were characterized using rocking curve measurements and x-ray topography with quasi-plane-wave incidence, and high resolution reciprocal space mapping. The rocking curves of the (111) crystals were comparable to the theoretical ones. Some crystals had wider rocking curves because of the higher density of stacking faults. Even the highest quality crystal did not give the theoretical rocking curve due to dislocations and strain bands. On the other hand, the (100) crystals had nearly perfect area. The difference was attributed to the orientation of the seed crystal.