A Non-Contact Guided Wave Technique for Defect Thinning Monitoring
A Non-Contact Guided Wave Technique for Defect Thinning Monitoring
复制标题
用于缺陷细化监测的非接触式导波技术
DOI：
10.4028/www.scientific.net/kem.326-328.681
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发表时间：
2006
期刊：
影响因子：
--
通讯作者：
Y. Cho
中科院分区：
文献类型：
--
作者：
I. Park;Yong Kwon Kim;Tae Hyung Kim;Y. Cho
本文利用非接触超声导波技术领域的最新进展。本技术提供了一个体面的方法来无损检测缺陷减薄模拟隐藏的腐蚀或FAC（流动加速腐蚀）在薄铝板。所提出的方法是基于使用电磁声换能器（EMAT）产生导波和检测壁薄没有任何耦合。在选定的导模的色散行为的有趣的功能用于检测板变薄。结果表明，模式截止测量允许我们监测缺陷减薄水平，而群速度的变化可以用来量化的减薄深度。
This paper capitalizes on recent advances in the area of non-contact ultrasonic guided wave techniques. The present technique provides a decent method for nondestructive testing of defect thinning simulating a hidden corrosion or FAC(Flow Accelerated Corrosion) in a thin aluminum plate. The proposed approach is based on using EMAT(Electro-magnetic Acoustic Transducer) to generate guided waves and detect the wall thinning without any coupling. Interesting features in the dispersive behavior of selected guided modes are used for the detection of plate thinning. It is shown that mode cut-off measurement allows us to monitor a defect thinning level while a group velocity change can be used to quantify the thinning depth.