Performance of SwiftScan planar and SPECT technology using low-energy high-resolution and sensitivity collimator compared with Siemens SPECT system
Performance of SwiftScan planar and SPECT technology using low-energy high-resolution and sensitivity collimator compared with Siemens SPECT system
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DOI：
10.1097/mnm.0000000000001400
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发表时间：
2021-07-01
影响因子：
1.5
通讯作者：
Nakajima, Kenichi
中科院分区：
文献类型：
--
作者：
Shibutani, Takayuki;Onoguchi, Masahisa;Nakajima, Kenichi
目的：通用电气医疗公司研制了一种新型低能量高分辨率高灵敏度（LEHRS）准直器。SwiftScan平面和单光子发射计算机断层扫描（SPECT）系统采用LEHRS准直器，以实现低剂量和/或短时间采集。方法采用线源、圆柱形和平板塑料盘模型，分别对Siemens LEHR、GE LEHR、GE LEHRS和SwiftScan四种型号的SPECT-CT扫描仪进行了平面和SPECT图像的性能评价。每个体模填充Tc-99 m解决方案，和空间分辨率，灵敏度和图像均匀性计算从平面和SPECT data.ResultsThe半高全宽（FWHM）的值作为一个系统的空间分辨率的西门子LEHR，GE LEHR和GE LEHRS约为7.4 mm。GE LEHRS表现出较低的FWHM值，通过增加混合比在Clarity 2D处理。GE LEHRS的系统灵敏度比GE LEHR提高约30%，与Siemens LEHR相似。滤波反投影（FBP）方法的SPECT的FWHM值约为10.3 mm。有序子集期望最大化（OSEM）方法的FWHM值随着迭代值的增加而更好。使用FBP方法的Siemens LEHR、GE LEHR、GE LEHRS和GE SwiftScan的微分均匀性约为15.1%。OSEM方法的微分均匀性随着迭代值的增加而提高。结论SwiftScan平面和SPECT与传统系统相比具有较高的灵敏度，同时保持了空间分辨率。
PurposeA new low-energy high-resolution-sensitivity (LEHRS) collimator was developed by General Electric (GE) Healthcare. SwiftScan planar and single photon emission computed tomography (SPECT) systems using LEHRS collimator were developed to achieve the low-dose and/or short-time acquisition. We demonstrated the performance of SwiftScan planar and SPECT system with LEHRS collimator using phantoms.MethodsLine source, cylindrical and flat plastic dish phantoms were used to evaluate the performance of planar and SPECT images for four patterns of Siemens LEHR, GE LEHR, GE LEHRS and SwiftScan using two SPECT-CT scanners. Each phantom was filled with Tc-99m solution, and the spatial resolution, sensitivity and image uniformity were calculated from the planar and SPECT data.ResultsThe full-width at half maximum (FWHM) values as a system spatial resolution of Siemens LEHR, GE LEHR and GE LEHRS were approximately 7.4 mm. GE LEHRS showed a lower FWHM value by increasing the blend ratio in Clarity2D processing. The system sensitivity of GE LEHRS increased by approximately 30% compared with that of GE LEHR and was similar to that of Siemens LEHR. The FWHM values of SPECT with an filtered back projection (FBP) method were approximately 10.3 mm. The FWHM values of the ordered subset expectation maximization (OSEM) method were better with an increase in iteration values. The differential uniformities of Siemens LEHR, GE LEHR, GE LEHRS and GE SwiftScan using the FBP method were approximately 15.1%. The differential uniformity of OSEM method was higher with an increase in the iteration value.ConclusionThe SwiftScan planar and SPECT have a high sensitivity while maintaining the spatial resolution compared with the conventional system.